The dynamic testing system includes units such as a high-voltage power supply, IGBT drive control board, high-voltage monitoring module, and high-speed acquisition module. It supports single pulse, double pulse, and multiple pulse testing, diode characteristic testing, stray inductance calculation, and short-circuit testing. The system can also provide rapid temperature variation environments ranging from room temperature to 150°C, suitable for automotive-grade testing. Custom low-inductance fixtures (≤20 nH) support various IGBT assembly module packages, enabling parallel module testing. The system’s testing voltage ranges from 20V to 6000V, and current ranges from 50A to 10,000A (optional). The dynamic testing system includes overcurrent protection, allowing for quick current circuit shutdown in the event of module failure.